Issue |
Ann. Phys. Fr.
Volume 9, Number 4, 1984
|
|
---|---|---|
Page(s) | 675 - 685 | |
DOI | https://doi.org/10.1051/anphys:0198400904067500 | |
Published online | 01 June 2004 |
Effects of ion motion on Stark profiles of overlapping neutral helium lines
1
Observatoire de Meudon, 92195 Meudon Cedex Principal, France
2
Institut d'Astrophysique, 98 bis, boulevard Arago, 75014 Paris, France
The basic ideas of the Model Microfield Method are shortly reviewed, as various theoretical and experimental works devoted to ion dynamics effects on overlapping helium line profiles.
Résumé
Les idées de base de la Méthode du Microchamp Modèle sont brièvement passées en revue, ainsi que divers travaux théoriques et expérimentaux portant sur les effets de dynamique des ions sur les profils des raies d'hélium à composantes interdites.
PACS: 0130R – Reviews and tutorial papers: resource letters / 3260S – Stark effect in atoms / 3270J – Atomic line shapes, widths, and shifts / 5270K – Optical ultraviolet, visible, infrared plasma diagnostic techniques
Key words: atomic spectral line breadth / helium / plasma diagnostics / reviews / Stark effect / He / reviews / ion motion / Stark profiles / ion dynamics effects / line profiles
© EDP Sciences, 1984