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Cited article:

Conceptual design of magnetic spectrometer for inverse-Compton X-ray source in MeV region

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AIP Advances 7 (10) (2017)
https://doi.org/10.1063/1.4999379

The differential equations defining deflection of particles of ion beam from axial trajectory in electric and magnetic fields

O.A. Baisanov, G.A. Doskeyev, T.G. Doskeyev and I.F. Spivak-Lavrov
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 645 (1) 159 (2011)
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Approach for investigating the astigmatism of a magnetic prism in low-energy electron microscopy

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Review of Scientific Instruments 74 (2) 1008 (2003)
https://doi.org/10.1063/1.1533099

A method for calculating phase-space densities in ion-optical systems

E. Hanelt and K.-H. Schmidt
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 321 (3) 434 (1992)
https://doi.org/10.1016/0168-9002(92)90051-5

A second-order approximation of particle motion in the fringing field of a dipole magnet

N.I. Tarantin
International Journal of Mass Spectrometry and Ion Physics 36 (2) 167 (1980)
https://doi.org/10.1016/0020-7381(80)80065-9

New magnetic electron spectrometer with directional sensitivity for a satellite application

A. Korth and B. Wilken
Review of Scientific Instruments 49 (10) 1435 (1978)
https://doi.org/10.1063/1.1135284

Systematic study of the focusing properties of a single- or double-focusing magnet. (Matrix method)

A G Elayi and M Gaillard
Journal of Physics A: Mathematical, Nuclear and General 7 (2) 186 (1974)
https://doi.org/10.1088/0305-4470/7/2/004

Symmetry Properties of Beam Handling Magnet Systems

J. C. Herrera and E. E. Bliamptis
Review of Scientific Instruments 37 (2) 183 (1966)
https://doi.org/10.1063/1.1720125

The geometrical aberrations of general electron optical systems I The conditions imposed by symmetry

Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences 257 (1086) 479 (1965)
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Effect of Extended Fringing Fields on Ion‐Focusing Properties of Deflecting Magnets

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Review of Scientific Instruments 35 (3) 278 (1964)
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Second‐Order Properties of Double‐Focusing Spectrometer with Nonuniform Magnetic Field

Hidetsugu Ikegami
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Advances in Electronics and Electron Physics Volume 8

Larkin Kerwin
Advances in Electronics and Electron Physics, Advances in Electronics and Electron Physics Volume 8 8 187 (1956)
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Third‐Order Aberration and Focusing with Sector‐Shaped Magnetic Fields

Daniel F. Dempsey
Review of Scientific Instruments 26 (12) 1141 (1955)
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Two‐Directional Focusing of Charged Particles with a Sector‐Shaped, Uniform Magnetic Field

William G. Cross
Review of Scientific Instruments 22 (10) 717 (1951)
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