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Cited article:
Florin Abelès
Ann. Phys., 12 5 (1950) 596-640
Published online: 2017-04-26
This article has been cited by the following article(s):
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J. R. Buschert, F. C. Peiris, N. Samarth, H. Luo and J. K. Furdyna Physical Review B 49 (7) 4619 (1994) https://doi.org/10.1103/PhysRevB.49.4619
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R Grousson, V Voliotis, P Lavallard, M L Roblin and R Planel Semiconductor Science and Technology 8 (7) 1217 (1993) https://doi.org/10.1088/0268-1242/8/7/006
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H. Kogelnik Springer Series in Electronics and Photonics, Guided-Wave Optoelectronics 26 7 (1990) https://doi.org/10.1007/978-3-642-75824-9_2
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A Johner, P Schaaf and A Schmitt Journal of Optics 20 (4) 157 (1989) https://doi.org/10.1088/0150-536X/20/4/002
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