Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Protein Interactions with Polyelectrolyte Multilayers:  Interactions between Human Serum Albumin and Polystyrene Sulfonate/Polyallylamine Multilayers

Guy Ladam, Csilla Gergely, Bernard Senger, et al.
Biomacromolecules 1 (4) 674 (2000)
https://doi.org/10.1021/bm005572q

Stop-pass behavior of acoustic waves in a 1D fractured system

Seiji Nakagawa, Kurt T. Nihei and Larry R. Myer
The Journal of the Acoustical Society of America 107 (1) 40 (2000)
https://doi.org/10.1121/1.428292

Advances in Solid State Physics 40

Frank Müller, Albert Birner, Jörg Schilling, Ralf B. Wehrspohn and Ulrich Gösele
Advances in Solid State Physics, Advances in Solid State Physics 40 40 545 (2000)
https://doi.org/10.1007/BFb0108378

The transfer matrices and electronic spectrum of the multilayered system in a homogeneous magnetic field

Yu G Peisakhovich
Journal of Physics A: Mathematical and General 32 (17) 3133 (1999)
https://doi.org/10.1088/0305-4470/32/17/306

X-ray and Neuron Reflectivity: Principles and Applications

Alain Gibaud
Lecture Notes in Physics Monographs, X-ray and Neuron Reflectivity: Principles and Applications 58 87 (1999)
https://doi.org/10.1007/3-540-48696-8_3

Surface plasmon resonance spectroscopy: prospects of superstrate refractive index variation for separate extraction of molecular layer parameters

G.V. Beketov, Yu.M. Shirshov, O.V. Shynkarenko and V.I. Chegel
Sensors and Actuators B: Chemical 48 (1-3) 432 (1998)
https://doi.org/10.1016/S0925-4005(98)00081-1

A structural study of β-casein adsorbed layers at the air–water interface using X-ray and neutron reflectivity

Besma Harzallah, Véronique Aguié-Béghin, Roger Douillard and Louis Bosio
International Journal of Biological Macromolecules 23 (1) 73 (1998)
https://doi.org/10.1016/S0141-8130(98)00035-X

On the reflectivity discontinuity generated by critical adsorption at the liquid-vapour interface

M. Geoghegan and G. Jannink
Proceedings of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences 454 (1970) 659 (1998)
https://doi.org/10.1098/rspa.1998.0179

Poly(ethylene oxide) adsorption onto chemically etched silicates by Brewster angle reflectivity

Zengli Fu and Maria M. Santore
Colloids and Surfaces A: Physicochemical and Engineering Aspects 135 (1-3) 63 (1998)
https://doi.org/10.1016/S0927-7757(97)00218-5

Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phtalate

A. Sassella, R. Tubino, A. Borghesi, M.E. Giardini and L. Quadrelli
Thin Solid Films 313-314 347 (1998)
https://doi.org/10.1016/S0040-6090(97)00844-4

Computer processing of electron microscope cross sections of multilayer mirrors

M. O. Flaissier, C. Guichet, M. Rasigni and G. Rasigni
Applied Optics 36 (25) 6491 (1997)
https://doi.org/10.1364/AO.36.006491

Closed-form solutions for one-dimensional inhomogeneous anisotropic medium in a special case. I. Direct scattering problem

Tie Jun Cui, Chang Hong Liang and W. Wiesbeck
IEEE Transactions on Antennas and Propagation 45 (6) 936 (1997)
https://doi.org/10.1109/8.585740

Frequency domain wave-splitting techniques for plane stratified bianisotropic media

George N. Borzdov
Journal of Mathematical Physics 38 (12) 6328 (1997)
https://doi.org/10.1063/1.532216

Validity of the Uniform Thin-Film Approximation for the Optical Analysis of Particulate Films

E. K. Mann, L. Heinrich and P. Schaaf
Langmuir 13 (18) 4906 (1997)
https://doi.org/10.1021/la970322p

Multilevel diffractive optical elements fabricated with a single amplitude - phase mask

Edgar Pawlowski and Herbert Engel
Pure and Applied Optics: Journal of the European Optical Society Part A 6 (6) 655 (1997)
https://doi.org/10.1088/0963-9659/6/6/007

Influence of incoherent superposition of light on ellipsometric coefficients

R. Joerger, K. Forcht, A. Gombert, M. Köhl and W. Graf
Applied Optics 36 (1) 319 (1997)
https://doi.org/10.1364/AO.36.000319

Modes of propagating light waves in thin films of boron nitride deposited by plasma enhanced chemical vapor deposition

J. Boudiombo, O. Baehr, A. Boudrioua, et al.
Materials Science and Engineering: B 46 (1-3) 96 (1997)
https://doi.org/10.1016/S0921-5107(96)01940-X

Subnanosecond density dynamics of the electrondashhole plasma in GaAs/AlAs microcavities

J.L. Iehl, R. Grac, J.H. Collet, et al.
Physica B: Condensed Matter 222 (1-3) 73 (1996)
https://doi.org/10.1016/0921-4526(95)00624-9

Interface roughness of InAs/AlSb superlattices investigated by x‐ray scattering

B. Jenichen, S. A. Stepanov, B. Brar and H. Kroemer
Journal of Applied Physics 79 (1) 120 (1996)
https://doi.org/10.1063/1.360918

A dual-wavelength vertical-cavity surface-emitting laser involving both the first and the second quantum states

Y Boucher, H Sauer, P Georges, et al.
Pure and Applied Optics: Journal of the European Optical Society Part A 5 (1) 35 (1996)
https://doi.org/10.1088/0963-9659/5/1/005

General inversion method for single-wavelength ellipsometry of samples with an arbitrary number of layers

S. Bosch and F. Monzonis
Journal of the Optical Society of America A 12 (6) 1375 (1995)
https://doi.org/10.1364/JOSAA.12.001375

Refractive-index profile reconstructions in planar waveguides by the WKB inverse method and reflectivity calculations

P. Mathey, P. Jullien and J. L. Bolzinger
Journal of the Optical Society of America B 12 (9) 1663 (1995)
https://doi.org/10.1364/JOSAB.12.001663

Hybrid modes in asymmetric periodic stratified dielectric waveguides

M. Ciumac and D. Mihalache
Journal of the Optical Society of America A 12 (8) 1695 (1995)
https://doi.org/10.1364/JOSAA.12.001695

Ellipsometrical study of indium sulfide film growth process on InP

B. I. Sysoev, V. D. Linnik, S. A. Titov and O. I. Kordenko
Physica Status Solidi (a) 143 (1) 71 (1994)
https://doi.org/10.1002/pssa.2211430109

Differential theory of gratings: extension to deep gratings of arbitrary profile and permittivity through the R-matrix propagation algorithm

F. Montiel and M. Neviere
Journal of the Optical Society of America A 11 (12) 3241 (1994)
https://doi.org/10.1364/JOSAA.11.003241

Tests of variable-band multilayers designed for investigating optimal signal-to-noise versus artifact signal ratios in dual-energy digital subtraction angiography (DDSA) imaging systems

D. Boyers, A. Ho, Q. Li, M. Piestrup, M. Rice and R. Tatchyn
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 346 (3) 565 (1994)
https://doi.org/10.1016/0168-9002(94)90593-2

Numerical modeling of the optical properties of hydrogenated amorphous‐silicon‐basedp‐i‐nsolar cells deposited on rough transparent conducting oxide substrates

F. Leblanc, J. Perrin and J. Schmitt
Journal of Applied Physics 75 (2) 1074 (1994)
https://doi.org/10.1063/1.356489

Efficient analysis of strongly absorbing inhomogeneous planar waveguides using exact transfer matrices for linearly, exponentially, and parabolically graded media

David M. Adams and John G. Simmons
Optics Communications 110 (3-4) 293 (1994)
https://doi.org/10.1016/0030-4018(94)90428-6

Unusual elastic constants of cubic MnTe in strained-layer superlattices measured by x-ray diffraction

J. R. Buschert, F. C. Peiris, N. Samarth, H. Luo and J. K. Furdyna
Physical Review B 49 (7) 4619 (1994)
https://doi.org/10.1103/PhysRevB.49.4619

Reflection and transmission properties of holographic mirrors and holographic Fabry–Perot filters III Holographic Fabry–Perot filters

Weijian Wang
Applied Optics 33 (34) 7883 (1994)
https://doi.org/10.1364/AO.33.007883

Field‐induced tuning of the optical properties of nonlinear composites near resonance

Ohad Levy, Yoad Yagil and David J. Bergman
Journal of Applied Physics 76 (3) 1431 (1994)
https://doi.org/10.1063/1.357747

Characterization of multilayer-interfaces by X-ray diffraction, TEM, SNMS and AES

S. Hopfe, N. Kallis, H. Mai, et al.
Fresenius' Journal of Analytical Chemistry 346 (1-3) 14 (1993)
https://doi.org/10.1007/BF00321375

Determination of excitonic properties in GaAs/Ga1-xAlxAs quantum wells by optical waveguiding experiments

R Grousson, V Voliotis, P Lavallard, M L Roblin and R Planel
Semiconductor Science and Technology 8 (7) 1217 (1993)
https://doi.org/10.1088/0268-1242/8/7/006

Soft-X-ray scattering and diffraction by a lamellar multilayer amplitude grating: experiment and theory

A. Sammar, M. Ouahabi, R. Barchewitz and J.-M. André
Optics Communications 99 (5-6) 309 (1993)
https://doi.org/10.1016/0030-4018(93)90334-2

Effect of the metal film thickness on surface‐plasmon‐enhanced Raman scattering in an attenuated total reflection experiment

N. Primeau, J. L. Coutaz and L. Abello
Journal of Applied Physics 73 (10) 5158 (1993)
https://doi.org/10.1063/1.353791

An intrinsic tensor technique in Minkowski space with applications to boundary value problems

George N. Borzdov
Journal of Mathematical Physics 34 (7) 3162 (1993)
https://doi.org/10.1063/1.530069

Diffraction analysis and experimental investigation of reflection-free holographic phase gratings

N Chateau, J C Saget and P Chavel
Pure and Applied Optics: Journal of the European Optical Society Part A 2 (4) 299 (1993)
https://doi.org/10.1088/0963-9659/2/4/003

Phonon Scattering in Condensed Matter VII

R. Fukasawa, M. Wakaki, K. Shirawachi, S. Nishizawa and K. Ohta
Springer Series in Solid-State Sciences, Phonon Scattering in Condensed Matter VII 112 373 (1993)
https://doi.org/10.1007/978-3-642-84888-9_147

Depth profiling of the Ge concentration in SiGe alloys usinginsituellipsometry during reactive‐ion etching

G. M. W. Kroesen, G. S. Oehrlein, E. de Frésart and M. Haverlag
Journal of Applied Physics 73 (12) 8017 (1993)
https://doi.org/10.1063/1.353916

Performance of Etched Laminar Multilayer Gratings in the Soft X-ray Region

J.-M. André, S. Bac, R. Barchewitz, et al.
Journal of Modern Optics 39 (8) 1681 (1992)
https://doi.org/10.1080/713823592

Practical considerations of the ir attenuated-total-reflection (ir-ATR) technique for electrochemical investigations

Brian W. Johnson, Jörg Bauhofer, Karl Doblhofer and Bruno Pettinger
Electrochimica Acta 37 (12) 2321 (1992)
https://doi.org/10.1016/0013-4686(92)85128-8

Lorentz-covariant surface impedance and characteristic matrix methods with applications to measurements of material parameters of linear media

G.N. Borzdov
Optics Communications 94 (1-3) 159 (1992)
https://doi.org/10.1016/0030-4018(92)90425-Q

Hologram recording by a pulsed method on phase-change media

Koutarou Nonaka, Yasuhide Nishida and Susumu Fujimori
Applied Optics 31 (26) 5724 (1992)
https://doi.org/10.1364/AO.31.005724

Accurate methods for simulating electroreflectance and photoreflectance spectra of GaAs

P. L. Jackson and E. G. Seebauer
Journal of Applied Physics 69 (2) 943 (1991)
https://doi.org/10.1063/1.347337

Characterization of SiO2/Si heterostructures by soft x‐ray reflection

S. C. Woronick, W. Ng, A. Król, Y. H. Kao and E. Arnold
Journal of Applied Physics 69 (3) 1631 (1991)
https://doi.org/10.1063/1.347260

Reducing the Berreman 4 × 4 propagation matrix method for layered inhomogeneous anisotropic media to the Abelés 2 × 2 matrix method for isotropic media

Hiap Liew Ong
Journal of the Optical Society of America A 8 (2) 303 (1991)
https://doi.org/10.1364/JOSAA.8.000303

Influence of Profile Parameters on the IR Thickness Measurement of Thin Silicon Epitaxial Layers

Ch. Quick, E. Hild, P. Schley and J. Quick
Crystal Research and Technology 26 (2) 223 (1991)
https://doi.org/10.1002/crat.2170260217

Automatic characterization of layers stacks from reflectivity measurements. Application to the study of the validity conditions of grazing X-rays reflectometry

F Bridou and B A Pardo
Journal of Optics 21 (4) 183 (1990)
https://doi.org/10.1088/0150-536X/21/4/005

Generalization of Bragg reflector geometry: Application to (Ga,Al)As‐(Ca,Sr)F2reflectors

C. Fontaine, P. Requena and A. Muñoz‐Yagüe
Journal of Applied Physics 68 (10) 5366 (1990)
https://doi.org/10.1063/1.347034

Matrix formalism for calculation of electric field intensity of light in stratified multilayered films

Koji Ohta and Hatsuo Ishida
Applied Optics 29 (13) 1952 (1990)
https://doi.org/10.1364/AO.29.001952

Power absorption coefficient constants for water, acetonitrile, and methylene chloride at far infrared wavelengths

J. K. Vij
International Journal of Infrared and Millimeter Waves 10 (7) 847 (1989)
https://doi.org/10.1007/BF01011496

Microscopic study of the reflection of light on a stratified interface under any incidence: validity of the macroscopic approximation for the determination of a refractive index profile

A Johner, P Schaaf and A Schmitt
Journal of Optics 20 (4) 157 (1989)
https://doi.org/10.1088/0150-536X/20/4/002

Abeles-Takagi approach for dynamic X-ray rocking curve analysis of superlattice structures

M C Shrivastava and S Swaminathan
Semiconductor Science and Technology 4 (6) 495 (1989)
https://doi.org/10.1088/0268-1242/4/6/013

The ellipticity introduced by interferential mirrors on a linearly polarized light beam orthogonally reflected

S. Carusotto, E. Polacco, E. Iacopini, et al.
Applied Physics B Photophysics and Laser Chemistry 48 (3) 231 (1989)
https://doi.org/10.1007/BF00694350

Capillary Waves and Bending Elasticity of Monolayers on Water Studied by X-Ray Reflectivity as a Function of Surface Pressure

J Daillant, L Bosio, J. J Benattar and J Meunier
Europhysics Letters (EPL) 8 (5) 453 (1989)
https://doi.org/10.1209/0295-5075/8/5/010