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Cited article:

An etched multilayer as a dispersive element in a curved‐crystal spectrometer: implementation and performance

P. Jonnard, K. Le Guen, J.‐M. André, J.‐R. Coudevylle and N. Isac
X-Ray Spectrometry 41 (5) 308 (2012)
https://doi.org/10.1002/xrs.2398