Articles citing this article

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Cited article:

Far‐ultraviolet absolute reflectometer for optical constant determination of ultrahigh vacuum prepared thin films

J. A. Aznárez, J. I. Larruquert and J. A. Méndez
Review of Scientific Instruments 67 (2) 497 (1996)
https://doi.org/10.1063/1.1146628

Quantitative total reflection X‐ray fluorescence analysis with monoenergetic excitation

Wolfgang Ladisich, Robert Rieder and Peter Wobrauschek
X-Ray Spectrometry 23 (4) 173 (1994)
https://doi.org/10.1002/xrs.1300230407

Diffraction of multilayer gratings and zone plates in the x-ray region using the Born approximation

A. Sammar and J-M. André
Journal of the Optical Society of America A 10 (4) 600 (1993)
https://doi.org/10.1364/JOSAA.10.000600

Multilayer gratings efficiency: numerical and physical experiments

A.I. Erko, B. Vidal, P. Vincent, et al.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 333 (2-3) 599 (1993)
https://doi.org/10.1016/0168-9002(93)91213-7

Total reflection X-ray fluorescence analysis with monoenergetic excitation and full spectrum excitation using rotating anode X-ray tubes

Wolfgang Ladisich, Robert Rieder, Peter Wobrauschek and Hannes Aiginger
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 330 (3) 501 (1993)
https://doi.org/10.1016/0168-9002(93)90582-3

Bent crystal, bent multilayer optics on a multipole wiggler line for an x-ray diffractometer with an imaging plate detector

R. Fourme, P. Dhez, J. P. Benoit, R. Kahn, J. M. Dubuisson, P. Besson and J. Frouin
Review of Scientific Instruments 63 (1) 982 (1992)
https://doi.org/10.1063/1.1143716