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Far-infrared dielectric constant of porous silicon layers measured by terahertz time-domain spectroscopy

S. Labbé-Lavigne, S. Barret, F. Garet, L. Duvillaret and J.-L. Coutaz
Journal of Applied Physics 83 (11) 6007 (1998)
DOI: 10.1063/1.367467
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