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Scanning Probe Microscopy in Nanoscience and Nanotechnology

Laurence Noirez
NanoScience and Technology, Scanning Probe Microscopy in Nanoscience and Nanotechnology 169 (2010)
DOI: 10.1007/978-3-642-03535-7_6
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Phase Transformation and Segregation to Lattice Defects in Ni-Base Superalloys

Didier Blavette, Emmanuel Cadel, Cristelle Pareige, Bernard Deconihout and Pierre Caron
Microscopy and Microanalysis 13 (06) 464 (2007)
DOI: 10.1017/S143192760707078X
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