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From optical to terahertz, frequency metrology with a single ion

C. Champenois, G. Hagel, M. Houssin, M. Knoop, M. Vedel, C. Zumsteg and F. Vedel

Ann. Phys. Fr., 32 2-3 (2007) 25-31

DOI: https://doi.org/10.1051/anphys:2008002

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